发明名称 REPAIR FUSE SET CIRCUIT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A repair fuse set circuit of a semiconductor device is provided to reduce an area of a repair fuse by forming a repair fuse set circuit having a structure where fuse sets formed on different layers are connected through a line. CONSTITUTION: Fuse sets(200A,200B) includes a plurality of fuse units which are electrically connected with each other through a fuse unit connection line. Fuse units respectively include a repair fuse set and a fuse set connection line. Lower fuses(DF0~DF3) and the first fuse set connection line are connected in parallel with each other. The connection line of the upper fuses and the second fuse set connection line are formed on the lower fuses and are connected in parallel with each other. The lower fuses, upper fuses, and a connection line of a first and a second fuse set connection line which are electrically connected with each other.
申请公布号 KR20100068949(A) 申请公布日期 2010.06.24
申请号 KR20080127473 申请日期 2008.12.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YUN, JAE WOONG
分类号 G11C29/04;G11C7/10 主分类号 G11C29/04
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