发明名称 SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a substrate inspection device and a substrate inspection method making it possible to easily discriminate a quality degradation of a parts mounting substrate caused by a deterioration with age. <P>SOLUTION: A still picture in each region of a wiring substrate in a process of mounting parts on the wiring substrate is picked up by still picture information output means 11. Still picture information for each region is output for each wiring substrate. A quality for each region is determined by quality determination means 12 based on the still picture information for each region output from the still picture information output means 11. Moreover, the still picture information for each region output from the static picture information output means 11 is memorized in storage means 15. Thereafter, moving picture information for each region is generated by moving picture information generating means 16 based on the static picture information memorized in the storage means 15. The moving picture information for each region is displayed on a display unit. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010141209(A) 申请公布日期 2010.06.24
申请号 JP20080317541 申请日期 2008.12.12
申请人 SONY CORP 发明人 KINOSHITA AKIO
分类号 H05K13/08;G01N21/956;H05K13/04 主分类号 H05K13/08
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