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发明名称	IC TESTING METHODS AND APPARATUS
摘要
申请公布号	EP1946131(B1)	申请公布日期	2010.06.23
申请号	EP20060821194	申请日期	2006.10.18
申请人	NXP B.V.	发明人	WAAYERS, TOM;MORREN, RICHARD
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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