发明名称 |
MONITORING APPARATUS, MONITORING METHOD, INSPECTING APPARATUS AND INSPECTING METHOD |
摘要 |
An inspecting apparatus is provided with an imaging section for imaging a first range and a second range, which is shifted from the first range in a prescribed direction, in an object to be inspected; a differential processing section for obtaining a differential between signals of sections which correspond to the prescribed direction in the image of the first range and that of the second range; and an inspecting section for inspecting existence of a defect in the object, based on the processing results obtained from the differential processing section.
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申请公布号 |
KR20100067659(A) |
申请公布日期 |
2010.06.21 |
申请号 |
KR20107007171 |
申请日期 |
2008.09.04 |
申请人 |
NIKON CORPORATION |
发明人 |
SAKAGUCHI NAOSHI;TAKAHASHI MASASHI;WATANABE TAKASHI |
分类号 |
G01N21/956;G01B11/30;G01N21/88;G01N21/89 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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