发明名称 MONITORING APPARATUS, MONITORING METHOD, INSPECTING APPARATUS AND INSPECTING METHOD
摘要 An inspecting apparatus is provided with an imaging section for imaging a first range and a second range, which is shifted from the first range in a prescribed direction, in an object to be inspected; a differential processing section for obtaining a differential between signals of sections which correspond to the prescribed direction in the image of the first range and that of the second range; and an inspecting section for inspecting existence of a defect in the object, based on the processing results obtained from the differential processing section.
申请公布号 KR20100067659(A) 申请公布日期 2010.06.21
申请号 KR20107007171 申请日期 2008.09.04
申请人 NIKON CORPORATION 发明人 SAKAGUCHI NAOSHI;TAKAHASHI MASASHI;WATANABE TAKASHI
分类号 G01N21/956;G01B11/30;G01N21/88;G01N21/89 主分类号 G01N21/956
代理机构 代理人
主权项
地址