发明名称 METHOD OF CONTROLLING PERIMETRY APPARATUS, PERIMETRY APPARATUS, AND HEAD-MOUNTED IMAGE DISPLAY APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a control method of a perimetry apparatus capable of examining with high accuracy, the perimetry apparatus, and a head-mounted image display apparatus. <P>SOLUTION: A control method of a perimetry apparatus which displays a gaze pattern for introducing a sight line of a subject to a predetermined position of a screen and a perimetry confirming pattern for confirming the perimetry of the subject, on the screen in order to measure the perimetry of the subject, and in which the gaze pattern has a plurality of designs, has the step of displaying the different designs on the predetermined position of the screen at every predetermined time and displaying the perimetry confirming pattern on any positions of the screen, the step of inputting predetermined information in accordance with the displayed design by the subject when the subject confirms the perimetry confirming pattern by sight, and the step of determining the perimetry of the subject based on the input information, the time from the display of the perimetry confirming pattern to the input of information, or any among them. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010131166(A) 申请公布日期 2010.06.17
申请号 JP20080309516 申请日期 2008.12.04
申请人 KONICA MINOLTA HOLDINGS INC 发明人 IIDA KENTARO;YAMASHITA MASANORI;IMAI SHIGEAKI;HIMEDA SATOSHI;ASO SATOSHI;YOSHII KEN
分类号 A61B3/024 主分类号 A61B3/024
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