| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of simplifying a circuit and efficiently carrying out a test, and to provide a testing method therefor. Ž<P>SOLUTION: The semiconductor device having an output circuit wherein a plurality of output MOSs arranged in parallel can operate in accordance with impedance adjusting bits, thereby making output impedance adjustable includes: an impedance measuring register for setting an operation mode; a boundary scan circuit for sending and receiving test data or holding a control signal in accordance with the output circuit or an input circuit containing the output circuit; a selector for replacing a resistance element with a built-in resistor and connecting it to an impedance adjusting circuit; and a test circuit which can output the impedance adjusting bit directly from a prescribed external terminal. Therefore, an operation of generating the impedance adjusting bit in accordance with the operation mode set by the register by using the built-in resistor is enabled, and the impedance adjusting bit can be outputted directly from the boundary scan circuit or the external terminal. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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