TESTING APPARATUS, CONVERSION CIRCUIT AND TESTING METHOD
摘要
<p>Provided is a testing apparatus for testing a device to be tested. The testing apparatus is provided with a serializer, which receives a parallel data of N bits (N is an integer of 2 or more), converts the parallel data into M pieces of serial data (M is a divisor of N) and outputs the serial data; a conversion control section which converts the frequency of each piece of serial data outputted from the serializer, corresponding to the number of pieces of serial data outputted from the serializer; and a signal generating section which generates a testing signal to be supplied to the device to be tested, based on each piece of serial data outputted from the serializer.</p>
