发明名称 APPEARANCE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To appropriately narrow down defect information displayed or output in an inspection system where an identical defect may be detected by two or more cameras under different timings. SOLUTION: The appearance inspection device includes a detection rack part 21 taking image data imaged by two or more camera devices 10 disposed back and forth along a conveying direction of paper 1, performing an image recognition processing per image data from each camera device, and determining existence or nonexistence of defects; and data treatment part 23 displaying the defect information detected and prepared through a defect treatment part 22 on a display 30 when a defect is detected by the detection rack part. The data treatment part includes a mechanism of comparing defect information for the identical information imaged by different camera devices and determining and displaying the defect information based on image data imaged by one camera device determined among the different camera devices in accordance with a determination rule as representative defect information. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010133846(A) 申请公布日期 2010.06.17
申请号 JP20080310771 申请日期 2008.12.05
申请人 OMRON CORP 发明人 NAKADA MASAHIRO
分类号 G01N21/892;G01B11/30;G06T1/00 主分类号 G01N21/892
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