| 发明名称 |
Test method for light diodes |
| 摘要 |
<p>The method involves operating light emitting diodes (1 to 5) in a normal operating mode with a pulse width modulated current signal and interrupting the normal operating mode. A short-circuit measurement is executed on only light emitting diode during the interruption of the normal operating mode.</p> |
| 申请公布号 |
EP2197243(A1) |
申请公布日期 |
2010.06.16 |
| 申请号 |
EP20080021177 |
申请日期 |
2008.12.05 |
| 申请人 |
DELPHI TECHNOLOGIES, INC. |
发明人 |
LANGENBACH, JULIA DR. |
| 分类号 |
H05B33/08 |
主分类号 |
H05B33/08 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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