发明名称 |
Semiconductor memory device having fuse circuits and method of controlling the same |
摘要 |
A non-volatile semiconductor memory device includes a read voltage generating circuit, a flash cell fuse circuit and a row decoder. The read voltage generating circuit generates a read voltage in response to a read enable signal and a trim code. The flash cell fuse circuit generates the trim code in response to a cell selection signal and a fuse word-line enable signal, the fuse word-line enable signal being activated after the read enable signal by a first delay time. The row decoder decodes the read voltage in response to a row address signal to generate a decoded read voltage, and to provide the decoded read voltage to a memory cell array.
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申请公布号 |
US7738309(B2) |
申请公布日期 |
2010.06.15 |
申请号 |
US20070946359 |
申请日期 |
2007.11.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON HONG-SOO;KIM DAE-HAN |
分类号 |
G11C17/18 |
主分类号 |
G11C17/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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