发明名称 Semiconductor memory device having fuse circuits and method of controlling the same
摘要 A non-volatile semiconductor memory device includes a read voltage generating circuit, a flash cell fuse circuit and a row decoder. The read voltage generating circuit generates a read voltage in response to a read enable signal and a trim code. The flash cell fuse circuit generates the trim code in response to a cell selection signal and a fuse word-line enable signal, the fuse word-line enable signal being activated after the read enable signal by a first delay time. The row decoder decodes the read voltage in response to a row address signal to generate a decoded read voltage, and to provide the decoded read voltage to a memory cell array.
申请公布号 US7738309(B2) 申请公布日期 2010.06.15
申请号 US20070946359 申请日期 2007.11.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON HONG-SOO;KIM DAE-HAN
分类号 G11C17/18 主分类号 G11C17/18
代理机构 代理人
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