发明名称 Chemical mechanical polishing compositions for copper and associated materials and method of using same
摘要 A CMP composition containing a rheology agent, e.g., in combination with oxidizing agent, chelating agent, inhibiting agent, abrasive and solvent. Such CMP composition advantageously increases the materials selectivity in the CMP process and is useful for polishing surfaces of copper elements on semiconductor substrates, without the occurrence of dishing or other adverse planarization deficiencies in the polished copper.
申请公布号 US7736405(B2) 申请公布日期 2010.06.15
申请号 US20030436381 申请日期 2003.05.12
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 DARSILLO MICHAEL;WRSCHKA PETER;BOGGS KARL
分类号 C09G1/02;C09G1/04;C09K3/14;C11D7/60;C23F3/06;C25F3/00;H01L21/321;H01L21/461 主分类号 C09G1/02
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