发明名称 IMAGING APPARATUS AND CONTROL METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To accurately detect and correct a temperature dependent linear defects even when it is a new linear defect by temporal change without photographing an image for correction separately. <P>SOLUTION: A mechanical shutter is closed after an imaging element is exposed for the prescribed time when picking up images. The image for correction is acquired by driving a vertical transfer path and a horizontal transfer path without reading signal charges stored in a plurality of photodetectors to the vertical transfer path in the period during which the mechanical shutter is closed. A photographed image is acquired by reading the signal charges stored in the plurality of photodetectors to the vertical transfer path and driving the vertical transfer path and the horizontal transfer path in the period during which the mechanical shutter is closed. The information of the linear defect on the vertical transfer path is extracted on the basis of the acquired image for the correction, and the acquired photographed image is corrected on the basis of the extracted information of the linear defect. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010130065(A) 申请公布日期 2010.06.10
申请号 JP20080299475 申请日期 2008.11.25
申请人 FUJIFILM CORP 发明人 YAMURA TAKEHIKO
分类号 H04N5/335;H04N5/367;H04N5/372;H04N5/376 主分类号 H04N5/335
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