MEMORY DEVICE AND FAULT DIAGNOSIS METHOD

摘要

Fault diagnosis having a high diagnostic rate can be performed independently of the content of the input test pattern. A write address counter (2) outputs a write address to a memory unit (1). An input data inversion unit (3) inverts the input data (8) and outputs the inverted input data to the memory unit (1). An input data selection unit (4) selects the input data or the inverted input data based on the bits included in the write address and writes the selected data to the memory unit (1). A read-out address counter (5) outputs the read-out address to the memory unit (1). An output data inversion unit (6) inverts the output data from the memory unit (1) and outputs the inverted output data. An output data selection unit (7) selects the output data or the inverted output data based on the bits included in the read-out address and outputs the data as the read-out data (9).