| 摘要 |
The invention relates to an Anti-Scatter-Grid (ASG) with lamellae (2) that absorb incident radiation (1, 8) and that produce an electrical signal proportional to the amount of absorbed radiation. The lamellae (2) may particularly consist of a semiconductor material in which photons produce electron-hole pairs that can be detected with the help of electrodes (3, 4, 6) on the sidewalls of the lamellae (2). The amount of absorbed scattered (8) or primary (1) radiation may thus be determined in a spatially resolved way, allowing to correct the image generated by an array (5) of sensor units (9).
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