发明名称 Post last wiring level inductor using patterned plate process
摘要 A method of a semiconductor device. A substrate is provided. At least one metal wiring level is within the substrate. An insulative layer is deposited on a surface of the substrate. An inductor is formed within the insulative layer using a patterned plate process. A wire bond pad is formed within the insulative layer, wherein at least a portion of the wire bond pad is substantially co-planar with the inductor.
申请公布号 US7732294(B2) 申请公布日期 2010.06.08
申请号 US20080170464 申请日期 2008.07.10
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHINTHAKINDI ANIL KUMAR;COOLBAUGH DOUGLAS DUANE;FLORKEY JOHN EDWARD;GAMBINO JEFFREY PETER;HE ZHONG-XIANG;STAMPER ANTHONY KENDALL;VAED KUNAL
分类号 H01L21/20 主分类号 H01L21/20
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