发明名称 Semiconductor device
摘要 A second-conductivity-type transistor includes a source and drain formed by a second-conductivity-type diffusion layer formed on a first-conductivity-type semiconductor layer; and a gate formed on the first-conductivity-type semiconductor layer sandwiched between the second-conductivity-type diffusion layer through an insulating film A first-conductivity-type transistor includes a source and drain formed by a first-conductivity-type diffusion layer formed on a second-conductivity-type semiconductor layer; and a gate formed on the second-conductivity-type semiconductor layer sandwiched between the first-conductivity-type diffusion layer through an insulating film. The second-conductivity-type diffusion layer for configuring the second-conductivity-type transistor is divided into a plurality of regions, each of which being separated by a device isolation region formed on the first-conductivity-type semiconductor layer. The first-conductivity-type diffusion layer for configuring the first-conductivity-type transistor is divided into a plurality of regions, each of which being separated by a device isolation region formed on the second-conductivity-type semiconductor layer.
申请公布号 US7732840(B2) 申请公布日期 2010.06.08
申请号 US20070864041 申请日期 2007.09.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUOKA FUMIYOSHI;WATANABE YOHJI;FUKUDA RYO
分类号 H01L21/76 主分类号 H01L21/76
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