发明名称 |
SILICON SINGLE CRYSTAL AND METHOD FOR GROWING THEREOF, AND SILICON WAFER AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
PURPOSE: A silicon single crystal and an upbringing method, a silicon wafer and a manufacturing method thereof are provided to manufacture a defect-free crystal by preventing a generation of a hydrogen defect in a pulling silicon single crystal by a hydrogen doping. CONSTITUTION: A crystal upbringing is processed in an atmosphere less than 400Pa over 40Pa. A cooling status controlling process sets a dwell time of a hydrogen collection temperature range over 550°C less than 850°C into over 100 minutes less than 480 minutes. The hydrogen is doped in the silicon single crystal through a melting material(c) by making an atmosphere gas into the atmosphere containing the hydrogen in an increasing the silicon single crystal. The single crystal is chilled from a silicon melting point according to increasing single crystal. A gas of the hydrogen-contained material is a hydrogen gas.
|
申请公布号 |
KR20100061360(A) |
申请公布日期 |
2010.06.07 |
申请号 |
KR20090114444 |
申请日期 |
2009.11.25 |
申请人 |
SUMCO CORPORATION |
发明人 |
ONO TOSHIAKI;FUJIWARA TOSHIYUKI;HOURAI MASATAKA;SUGIMURA WATARU |
分类号 |
C30B15/20 |
主分类号 |
C30B15/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|