发明名称 METHOD OF MANUFACTURING THIN-FILM TRANSISTOR SUBSTRATE
摘要 Provided is a method for manufacturing a thin-film transistor substrate, in which the etching characteristics of an insulating film and a passivation layer are enhanced. The insulating film and the passivation layer are deposited by low temperature chemical vapor deposition. The method includes disposing a gate wiring on an insulating substrate; disposing a gate insulating film on the gate wiring; disposing a data wiring on the gate insulating film; disposing a passivation layer on the data wiring; and forming a contact hole by etching at least one of the gate insulating film and the passivation layer, wherein at least one of the gate insulating film and the passivation layer is disposed at a temperature of about 280° C. or below, and the forming of the contact hole is performed at a pressure of about 60 mT or below.
申请公布号 US2010136775(A1) 申请公布日期 2010.06.03
申请号 US20090607567 申请日期 2009.10.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SEUNG-HA;KIM SANG-GAB;SHIN BONG-KYU;LIM SANG-UK;JU JIN-HO;YANG SUNG-HOON;WHANGBO SANG-WOO;CHOI JAE-HO;LEE KI-YEUP;YEO YUN-JONG;CHOI SHIN-IL;YANG DONG-JU;CHIN HONG-KEE;JEONG YU-GWANG
分类号 H01L21/28 主分类号 H01L21/28
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