发明名称 DC MODULE AND SEMICONDUCTOR-TESTING DEVICE USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem, wherein since high resistance is used as a first resistor to assure measurement accuracy in a DC module, in which the output from an output amplifier for outputting constant voltage or constant current is applied via a first switch to an object to be measured, also the voltage of the object is fed back to the output amplifier via a second switch, and the first resistor is provided between an output terminal of the output amplifier and the second switch, it takes time to charge a stray capacitance, and as a result, it takes time to change-over from a non-application mode to a current application mode. Ž<P>SOLUTION: A third switch is connected in parallel with the first resistor, and the third switch is turned on, when change-over to short-circuit the first resistor is made. Since the stray capacitance can be charged rapidly, the time for change-over can be shortened. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010122149(A) 申请公布日期 2010.06.03
申请号 JP20080297910 申请日期 2008.11.21
申请人 YOKOGAWA ELECTRIC CORP 发明人 TAKEDA KENICHI
分类号 G01R31/28;G01R31/26;G05F1/10 主分类号 G01R31/28
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