发明名称 SYSTEM AND METHOD FOR IMPLEMENTING A STRIDE VALUE FOR MEMORY TESTING
摘要 Systems and methods for implementing a stride value for memory are provided. One embodiment relates to a system that includes a plurality of memory modules configured to store interleaved data in a plurality of memory storage units according to a predetermined interleave. A memory test device is configured to perform a memory test that accesses a portion of the plurality of memory storage units in a sequence according to a programmable stride value. The memory test device performs the memory test by writing test data to each of the memory storage units in the portion of the plurality of memory storage units and reading the test data from each of the memory storage units in the portion of the plurality of memory storage units.
申请公布号 US2010131810(A1) 申请公布日期 2010.05.27
申请号 US20100694718 申请日期 2010.01.27
申请人 THAYER LARRY J;WALTON ANDREW C;COGDILL MIKE H 发明人 THAYER LARRY J.;WALTON ANDREW C.;COGDILL MIKE H.
分类号 G11C29/10;G06F11/07;G06F11/263;G06F12/00 主分类号 G11C29/10
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