| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of shortening a test time. Ž<P>SOLUTION: This semiconductor testing device wherein an operation control unit tests a DUT by changing setting of an internal circuit based on a set value of a set parameter is provided with an I/F circuit into which the set parameter is inputted, for comparing the set value of a new set parameter with the set value of a set parameter inputted in the preceding time, and transmitting an interruption signal to the operation control unit in the case of being changed. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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