发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device reduced in an influence of the displacement of a contact on characteristics of a circuit. SOLUTION: The semiconductor device includes: an element separating film 20 provided in a semiconductor layer 10; an element forming region zoned by the element separating film 20; gate wiring 140 extending over the element forming region and the element separating film 20; a sidewall 150 formed on the sidewall of the gate wiring 140; and a contact 200 connected with the gate wiring 140 positioned on the element separating film 20. The sidewall of the gate wiring 140 has a region 144 contacting with the contact 200 at least at an upper part of the region. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010118410(A) 申请公布日期 2010.05.27
申请号 JP20080289187 申请日期 2008.11.11
申请人 NEC ELECTRONICS CORP 发明人 MIYAKE SHINICHI
分类号 H01L21/8234;H01L21/336;H01L21/768;H01L23/522;H01L27/088;H01L29/423;H01L29/49;H01L29/78;H01L29/786 主分类号 H01L21/8234
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