发明名称 METHOD OF EVALUATING LIQUID CRYSTAL DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of evaluating a liquid crystal device capable of simply judging deterioration with high precision. Ž<P>SOLUTION: The method for evaluating the liquid crystal device 2 is a method for evaluating the liquid crystal device 2 equipped with a liquid crystal panel 6 having a pair of electrodes and includes the step for applying predetermined AC voltage across a pair of the electrodes of the liquid crystal panel 6, the step for measuring the value of the current having amplitude and a phase flowing through the liquid crystal panel 6 at the time of application of the AC voltage, the step for calculating the value of the complex impedance having the real part and imaginary part of the liquid crystal panel 6 from the respective values of the AC voltage and the current, the step for calculating the dielectric loss of the complex dielectric constant of the liquid crystal panel 6 from the respective values of the real part and imaginary part of the complex impedance, and the step for evaluating the light-resistant life of the liquid crystal panel 6 by comparing the dielectric loss with a predetermined value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010117198(A) 申请公布日期 2010.05.27
申请号 JP20080289519 申请日期 2008.11.12
申请人 SEIKO EPSON CORP 发明人 YOSHIDA SHOHEI
分类号 G01N27/02;G01N27/00;G01N27/22;G02F1/13 主分类号 G01N27/02
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