发明名称 SEMICONDUCTOR MEMORY DEVICE FOR SETTING DEFECT FREE BLOCK AS BOOT BLOCK AND METHOD THEREOF
摘要 PURPOSE: A semiconductor memory device and a boot block setting method thereof are provided to set an arbitrary defect free block as the boot block by including an electrical fuse part storing fuse information addressing the defect free block. CONSTITUTION: An electrical fuse part(210) stores fuse information addressing a defect free block inside memory blocks. A latch part(220) latches fuse information. A comparison part compares the fuse information latched in the latch part with the address signals addressing memory blocks. A comparison part(230) generates an address signal for a boot block. The defect free block is got from a test result in a package state after assembling a semiconductor memory device.
申请公布号 KR20100053203(A) 申请公布日期 2010.05.20
申请号 KR20080112219 申请日期 2008.11.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YOU SANG;JO, SUNG KYU
分类号 G11C16/06;G11C16/08;G11C16/34 主分类号 G11C16/06
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