| 发明名称 |
Test method for determining microstructure deformation resistance of a microstructured film |
| 摘要 |
Test method for determining (e.g. prism) microstructure deformation of a microstructured (e.g. brightness enhancing) film are described.
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| 申请公布号 |
US7716999(B2) |
申请公布日期 |
2010.05.18 |
| 申请号 |
US20080245046 |
申请日期 |
2008.10.03 |
| 申请人 |
3M INNOVATIVE PROPERTIES COMPANY |
发明人 |
HESSELROTH ADAM H.;DREYER STEPHEN J;DUPRE MARK R. |
| 分类号 |
G01L1/04 |
主分类号 |
G01L1/04 |
| 代理机构 |
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