发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method of manufacturing a semiconductor device is provided to prevent the electrical short between patterns by preventing bend and falling of the pattern. CONSTITUTION: An etching object film is formed on a semiconductor substrate(100). A first patter is formed by etching an object film. The first mask pattern is removed. The first insulating layer(112) is buried between first patterns. A second pattern is formed by etching the first pattern. The second mask pattern is removed. The second insulating layer(116) is buried between second patterns.</p>
申请公布号 KR20100050974(A) 申请公布日期 2010.05.14
申请号 KR20080110120 申请日期 2008.11.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JAE KI
分类号 H01L21/027 主分类号 H01L21/027
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