| 摘要 |
The method involves calculating initial, intermediate and following profiles (40, 44, 46) from a segment defined on an image of a zone to be analyzed of a piece, where pixel of the profiles is equal to a variation in gray level in a corresponding pixel of the segment along a length and a direction of the segment. Each of initial and following measuring points (25, 26) is a pixel for which the variation of gray levels along the length and the direction of corresponding measurement profile is maximum, where the pixel is computed by a gray levels maximum variation determining algorithm. Independent claims are also included for the following: (1) a computer program product comprising a set of instructions for implementing a method for characterizing a surface defect of a stamped piece (2) an installation for characterizing a surface defect of a stamped piece. |
