发明名称 RINSE SOLUTION FOR REMOVING THICK FILM RESIST
摘要 <p>A rinse solution for removing thick film resist includes dimethylsulfoxide, potassium hydroxide, alcohol amine, alkyl diol aryl ether and corrosion inhibitor of polyacrylic acid series. The alkyl glycol of alkyl glycol aryl ether has 3-18 carbon atoms. The rinse solution for removing thick resist may clean thick resist on a metal, metal alloy or dielectric substrate, especially clean more 100µm thickness resist. Meanwhile the rinse solution has low etch rate for metals such as Al and Cu, and nonmetals such as SiO2 with very low damage to the wafer pattern and the substrate. The rinse solution may be used in a large scope of temperature.</p>
申请公布号 WO2010051689(A1) 申请公布日期 2010.05.14
申请号 WO2009CN01233 申请日期 2009.11.05
申请人 ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;PENG, LIBBERT, HONGXIU 发明人 PENG, LIBBERT, HONGXIU
分类号 G03F7/42;C11D1/66;C23G1/06;H01L21/02 主分类号 G03F7/42
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