发明名称 |
SYSTEMS AND METHODS FOR LOCATING DEFECTIVE COMPONENTS OF A CIRCUIT |
摘要 |
According to exemplary methods and systems of the present principles, the location of defective field repairable units (FRUS) of a circuit that have varying sizes or varying numbers of scan cells may be identified by employing tiles including scan cells from different FRUS. A set of test patterns may be scanned through the scan cells such that cells belonging to FRUs within a tile may be concealed while analyzing the response of scan cells in the tile contributed by a different FRU. Further, defective tiles are discoverable at any tile location and in any quantity within a maximal capacity using a compressed signature. In addition, signature registers that process data at a rate that is faster than the scan shift rate of the circuit may be employed during compression to multiply a circuit response by a plurality of components of a compression matrix during one scan shift cycle.
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申请公布号 |
US2010121585(A1) |
申请公布日期 |
2010.05.13 |
申请号 |
US20090393533 |
申请日期 |
2009.02.26 |
申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
WANG SEONGMOON;TANG XIANGYU |
分类号 |
G01R31/00;G06F19/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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