发明名称 SEMICONDUCTOR MEMORY DEVICE AND TESTING METHOD THEREFOR
摘要 A semiconductor memory device comprises a plate voltage generating circuit that generates a plate voltage supplied to a memory cell array and a plate voltage supply terminal that supplies a plate voltage from the outside. A first switching circuit is provided to switch the supply of the plate voltage between the supply from the plate voltage generating circuit and the supply from the outside through the plate voltage supply terminal.
申请公布号 US2010122131(A1) 申请公布日期 2010.05.13
申请号 US20090616871 申请日期 2009.11.12
申请人 ELPIDA MEMORY, INC. 发明人 RIHO YOSHIRO
分类号 G11C29/44;G06F11/22;G11C5/14 主分类号 G11C29/44
代理机构 代理人
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