发明名称 METHOD FOR CLEANING A SUBSTRATE
摘要 PURPOSE: A method for cleaning a substrate is provided to suppress the generation of protruded type derivatives by removing residue on the surface of a substrate with ozone wafer and diluted fluoric acid. CONSTITUTION: After a mirror-like polishing process is performed to a substrate, ozone water is supplied to clean the substrate(S110). A diluted fluoric acid is supplied to clean the substrate(S120). The ozone water is additionally supplied to clean the substrate(S130). A first standard cleaning solution is repeatedly supplied to remove particles and organics on the surface of the substrate(S200). A second standard cleaning solution and the first standard cleaning solution are successively supplied to remove metal impurities from the substrate(S300).
申请公布号 KR20100049856(A) 申请公布日期 2010.05.13
申请号 KR20080108865 申请日期 2008.11.04
申请人 SILTRON INC. 发明人 AHN, JIN WOO;CHOI, EUN SUCK;SIM, WOO YOUNG;SONG, BYOUNG CHUL;PARK, JUNG KIL
分类号 H01L21/302 主分类号 H01L21/302
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