发明名称 |
METHOD FOR CLEANING A SUBSTRATE |
摘要 |
PURPOSE: A method for cleaning a substrate is provided to suppress the generation of protruded type derivatives by removing residue on the surface of a substrate with ozone wafer and diluted fluoric acid. CONSTITUTION: After a mirror-like polishing process is performed to a substrate, ozone water is supplied to clean the substrate(S110). A diluted fluoric acid is supplied to clean the substrate(S120). The ozone water is additionally supplied to clean the substrate(S130). A first standard cleaning solution is repeatedly supplied to remove particles and organics on the surface of the substrate(S200). A second standard cleaning solution and the first standard cleaning solution are successively supplied to remove metal impurities from the substrate(S300).
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申请公布号 |
KR20100049856(A) |
申请公布日期 |
2010.05.13 |
申请号 |
KR20080108865 |
申请日期 |
2008.11.04 |
申请人 |
SILTRON INC. |
发明人 |
AHN, JIN WOO;CHOI, EUN SUCK;SIM, WOO YOUNG;SONG, BYOUNG CHUL;PARK, JUNG KIL |
分类号 |
H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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