发明名称 SPR MEASUREMENT CHIP INTEGRAL WITH REFRACTIVE INDEX MATCHING SHEET
摘要 PROBLEM TO BE SOLVED: To provide a chip for SPR measurement allowing the use of a low-priced transparent substrate with a metallic thin film formed thereon without using matching oil and facilitating the replacement of the substrate, with regard to an SPR optical system. SOLUTION: This chip 200 for SPR measurement used in an SPR optical system 310 includes a transparent substrate 202 comprising a metallic thin film 203 for SPR measurement, and further, a transparent elastic adhesive sheet 201 on a surface of the transparent substrate 202 on the opposite side of the thin film 203. The adhesive sheet 201 is formed directly on the transparent substrate 202, and has the same refractive index as a prism 303 and the transparent substrate 202 have. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010101645(A) 申请公布日期 2010.05.06
申请号 JP20080271100 申请日期 2008.10.21
申请人 NTT ADVANCED TECHNOLOGY CORP;NIPPON TELEGR & TELEPH CORP <NTT> 发明人 HIDA TATSUYA;MIYAUCHI HIDEO;HORIUCHI TSUTOMU;IWASAKI GEN;MIURA TATSU;SEYAMA TOMOKO;TAKAHASHI JUNICHI;HAGA TSUNEYUKI
分类号 G01N21/27 主分类号 G01N21/27
代理机构 代理人
主权项
地址