发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To readily detect in a semiconductor device whether a voltage lying within the specifications of the semiconductor device is obtained. <P>SOLUTION: The semiconductor device includes a detection circuit that detects an output voltage of an internal circuit of the semiconductor device and determines, whether the output voltage is within or out of the specifications of the semiconductor device. A signal for determining whether the output voltage lies within or out of the specifications is transmitted from the detecting circuit to a digital circuit, and the digital circuit performs or stops circuit operation in response to the signal. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010103503(A) 申请公布日期 2010.05.06
申请号 JP20090215490 申请日期 2009.09.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MATSUMOTO CHIKAKO;TAKAHASHI YASUYUKI
分类号 H01L21/822;G06K19/07;H01L21/8234;H01L27/04;H01L27/06;H01L27/088 主分类号 H01L21/822
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