发明名称 SEMICONDUCTOR DEVICE, APPARATUS AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To produce a desired SiN film by low-temperature processing. SOLUTION: A method for manufacturing a semiconductor device includes: a means for supplying a nitride-based gas (nitride (N<SB>2</SB>) gas, ammonium (NH<SB>3</SB>) gas, diazine (N<SB>2</SB>H<SB>2</SB>) gas or hydrazine (N<SB>2</SB>H<SB>4</SB>) gas etc.) to an object to be treated; a means for supplying a silicon-based gas (gas containing amino group, dimethylamino group or ethyl amino group, silane gas, disilane gas or disilazane gas etc.) to the object; and a means for bringing the object into a depressurized environment in supplying each of the gasses. COPYRIGHT: (C)2010,JPO&amp;INPIT
申请公布号 JP2010103484(A) 申请公布日期 2010.05.06
申请号 JP20090186634 申请日期 2009.08.11
申请人 ADEKA CORP;NANO MATERIAL KENKYUSHO:KK 发明人 ONOZAWA KAZUHISA;SHIOTANI YOSHIMI
分类号 H01L21/31;C23C16/42;C23C16/48;C23C16/507;H01L21/318 主分类号 H01L21/31
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