发明名称 EXPOSURE APPARATUS AND PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To improve the efficiency of exposure processing by simultaneously forming two kinds of exposure patterns having different required resolutions from each other in the same exposure step. <P>SOLUTION: An exposure pattern is formed on a TFT substrate 8 coping with a plurality of mask patterns formed on a photomask 3 by intermittently irradiating the TFT substrate 8 through the photomask 3 with light 24 from a light source while conveying the TFT substrate 8 in one direction. The photomask 3 has an electrode wiring pattern 14 and a signal wiring pattern 17 in different required resolving powers from each other, formed on one surface of the mask such that an electrode wiring pattern group 16 comprising a plurality of electrode wiring patterns 14 and a signal wiring pattern group 18 comprising a plurality of signal wiring patterns 17 are sequentially formed along a conveying direction of the TFT substrate 8. On the other surface of the photomask, a microlens 19 that reduces and projects the electrode wiring pattern 14 having a high required resolving powder onto the TFT substrate 8 is formed coping with the electrode wiring pattern. The photomask is disposed with the microlens 19 side close to the TFT substrate 8. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010102149(A) 申请公布日期 2010.05.06
申请号 JP20080273863 申请日期 2008.10.24
申请人 V TECHNOLOGY CO LTD 发明人 MIZUMURA MICHINOBU
分类号 G03F7/20;G02F1/13;G02F1/1368;G03F1/00;G03F1/70;H01L21/027 主分类号 G03F7/20
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