发明名称 PAA-based etchant, methods of using same, and resultant structures
摘要 A wet-etch composition may include: peracetic acid (PAA); and a fluorinated acid; a relative amount of the PAA in the composition being sufficient to ensure an etch rate of (P-doped-SiGe):(P-doped-Si) that is substantially the same as an etch rate of (N-doped-SiGe):(N-doped-Si). Such a wet-etch composition is hereafter referred to as a PAA-based etchant and can be used to make, e.g., a CMOS MBCFET, an electrode of a capacitor, etc.
申请公布号 US7709277(B2) 申请公布日期 2010.05.04
申请号 US20060600224 申请日期 2006.11.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE HYO-SAN;KO HUNG-HO;HONG CHANG-KI;CHOI SANG-JUN
分类号 H01L21/00;H01L21/308;C09K13/08;C23F1/24;G11C8/02;H01L21/302;H01L21/306;H01L21/3213;H01L21/336;H01L21/461;H01L21/8238;H01L21/8242;H01L27/108;H01L29/786 主分类号 H01L21/00
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