发明名称 ETCHING DEVICE, ETCHING METHOD, ETCHING PROGRAM, AND FILM FORMING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an etching device capable of satisfactorily processing a substrate into an arbitrary shape, an etching method, an etching program, and a film forming device. SOLUTION: An etching device 30 is provided with an ion gun 11, an XY stage 12, a control unit 13, and a PC 15. An etching amount of each of regions divided like a grid of a substrate 31 to be etched is calculated in accordance with a distribution of the thickness of the substrate 31 which is preliminarily measured, and the PC 15 determines an etching time in each region so that the region is etched up to the etching amount. In the case of the existence of a region of which the etching time is negative, this region is covered with a shutter 40 to prevent the excessive etching of the region of which the etching time is negative. Thus the substrate 31 is processed into an arbitrary shape. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010098051(A) 申请公布日期 2010.04.30
申请号 JP20080266364 申请日期 2008.10.15
申请人 SHOWA SHINKU:KK 发明人 SHIONO TADAHISA
分类号 H01L21/302;H01L21/203;H01L21/3065 主分类号 H01L21/302
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