发明名称 ELECTROSTATIC CHUCK
摘要 PROBLEM TO BE SOLVED: To provide an electrostatic chuck, having a long life and superior abrasion resistance which restrains wafer suction surface or the electrostatic suction mounting surface from being scratched, and which suppresses generation of dust. SOLUTION: The electrostatic chuck 1 for chucking an object, such as, a semiconductor wafer or a glass substrate, such that an insulation layer 5, forming a surface for sucking the object, is formed to cover electrodes 3a, 3b for electrostatic chucking formed on one surface of a supporting substrate 2, the insulation layer 5 has a coefficient of dynamic friction of 0.3 or less and a large number of micro recesses are formed on the surface of the insulation layer 5. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010097961(A) 申请公布日期 2010.04.30
申请号 JP20070002138 申请日期 2007.01.10
申请人 SHIN-ETSU CHEMICAL CO LTD 发明人 KANO MASAKI;YAMAMURA KAZUICHI
分类号 H01L21/683;H02N13/00 主分类号 H01L21/683
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