发明名称 TECHNIQUES FOR ATOMIC LAYER DEPOSITION
摘要 Techniques for atomic layer deposition (ALD) are disclosed, in one particular exemplary embodiment, the techniques may be realized as a system for ALD comprising a plurality of reactors in a stacked configuration, wherein each reactor comprises a wafer holding portion for holding a target wafer, a gas assembly coupled to the plurality of reactors and configured to provide at least one gas to at least one of the plurality of reactors, and an exhaust assembly coupled to the plurality of reactors and configured to exhaust the at least one gas from the at least one of the plurality of reactors. The gas assembly may further comprise a valve assembly coupled to each of the first gas inlet, the second gas inlet, and the third gas inlet, where the valve assembly is configured to selectively release at least one of the first gas, the second gas, and the third gas.
申请公布号 WO2010048161(A2) 申请公布日期 2010.04.29
申请号 WO2009US61298 申请日期 2009.10.20
申请人 VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES;MURAKAWA, SHIGEMI;SINGH, VIKRAM;PAPASOULIOTIS, GEORGE, D.;OLSON, JOSEPH, C.;MURPHY, PAUL, J.;DICKERSON, GARY, E. 发明人 MURAKAWA, SHIGEMI;SINGH, VIKRAM;PAPASOULIOTIS, GEORGE, D.;OLSON, JOSEPH, C.;MURPHY, PAUL, J.;DICKERSON, GARY, E.
分类号 H01L21/205 主分类号 H01L21/205
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