发明名称 Sample analyzer and calibration method of sample analyzer
摘要 A sample analyzer is disclosed that comprises: a first measurement unit for measuring a sample; a second measurement unit for measuring a sample; and an information processing unit for acquiring a first analysis result based on a result of the measurement by the first measurement unit and a second analysis result based on a result of the measurement by the second measurement unit, wherein the information processing unit is configured to: correct the first analysis result based on a first correction value, correct the second analysis result based on a second correction value, update the first correction value, and update the second correction value. A calibration method of a sample analyzer is also disclosed.
申请公布号 US2010105142(A1) 申请公布日期 2010.04.29
申请号 US20090589863 申请日期 2009.10.28
申请人 SYSMEX CORPORATION 发明人 FUKUMA DAIGO;SHIBATA MASAHARU
分类号 G01N31/00;G01N33/00 主分类号 G01N31/00
代理机构 代理人
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