发明名称 MEMORY TEST DEVICE AND METHODS THEREOF
摘要 In accordance with a specific embodiment of the present disclosure, a content addressable memory (CAM) of a data processing device can operate in a normal mode or a test mode. In the normal mode, the CAM provides a match value in response to determining that a received data value matches one of a plurality of values stored at memory locations of the CAM. In a test mode of operation, a plurality of test signals are applied to the CAM, and the CAM provides a match value in response to assertion of one of the test signals. The match value is applied to a functional module associated with the CAM to determine a test result. Accordingly, the test signals applied to the CAM provide a flexible way to generate match values and apply those values to the functional module during testing of the data processing device.
申请公布号 US2010103712(A1) 申请公布日期 2010.04.29
申请号 US20080260553 申请日期 2008.10.29
申请人 ADVANCED MICRO DEVICES, INC. 发明人 IRBY JOEL T.;NATARAJAN KARTHIK
分类号 G11C15/00;G11C7/00;G11C29/00 主分类号 G11C15/00
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