发明名称 METHOD AND DEVICE FOR ANALYZING SPECIMEN
摘要 PROBLEM TO BE SOLVED: To heighten the sensitivity and accuracy of analysis using a time-of-flight mass spectrometer. SOLUTION: Cluster particles are used as primary incoming particles to generate a plurality of secondary particles per primary incoming particle pulse, and the secondary particles are analyzed by using the time-of-flight mass spectrometer 18. By means of a digital oscilloscope 25, detection signals on the secondary particles are counted with an equal probability independently of flight times of the secondary particles, with a pulsing signal for pulsing the incoming particle used as a base time signal. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010091292(A) 申请公布日期 2010.04.22
申请号 JP20080258802 申请日期 2008.10.03
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE& TECHNOLOGY;JAPAN ATOMIC ENERGY AGENCY 发明人 HIRATA KOICHI;ITO KENJI;SAITO YUICHI;CHIBA ATSUYA;NARUMI KAZUMASA;YAMADA KEISUKE
分类号 G01N23/225;G01N27/62;H01J49/40 主分类号 G01N23/225
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