发明名称 |
METHOD AND DEVICE FOR ANALYZING SPECIMEN |
摘要 |
PROBLEM TO BE SOLVED: To heighten the sensitivity and accuracy of analysis using a time-of-flight mass spectrometer. SOLUTION: Cluster particles are used as primary incoming particles to generate a plurality of secondary particles per primary incoming particle pulse, and the secondary particles are analyzed by using the time-of-flight mass spectrometer 18. By means of a digital oscilloscope 25, detection signals on the secondary particles are counted with an equal probability independently of flight times of the secondary particles, with a pulsing signal for pulsing the incoming particle used as a base time signal. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010091292(A) |
申请公布日期 |
2010.04.22 |
申请号 |
JP20080258802 |
申请日期 |
2008.10.03 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE& TECHNOLOGY;JAPAN ATOMIC ENERGY AGENCY |
发明人 |
HIRATA KOICHI;ITO KENJI;SAITO YUICHI;CHIBA ATSUYA;NARUMI KAZUMASA;YAMADA KEISUKE |
分类号 |
G01N23/225;G01N27/62;H01J49/40 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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