Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests

摘要

According to one embodiment of the invention, a semiconductor chip includes: a test target circuit to which a given burn-in stress is applied; and a burn-in counter that is configured: to acquire a first parameter indicating a test voltage applied to the test target circuit and a second parameter indicating a temperature of the test target circuit; to estimate the given burn-in stress from the first parameter and the second parameter; and to output burn-in stress information corresponding to the estimated burn-in stress.