发明名称 METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING PLASMA REACTOR PROCESSING SYSTEM
摘要 To enable change of a concentration of atmosphere in a process chamber and realize a plasma reaction process required for manufacturing a liquid crystal device and a semiconductor device with a high yield at a low cost. A new flow rate setting value given to a pressure control type flow rate adjusting device of each constituent gas is a value obtained by calculating back from the process gas concentration after an estimated change under the condition that the total flow rate value is identical before and after the concentration change. A pressure controller of an exhaust pipe is switched from a pressure setting mode to a valve open setting mode only for a predetermined small time from the modification start and receives a valve open setting value obtained experimentally so as to mitigate the pressure fluctuation immediately after the change.
申请公布号 US2010093111(A1) 申请公布日期 2010.04.15
申请号 US20070445424 申请日期 2007.10.12
申请人 OMRON CORPORATION 发明人 INOUE YOSHINORI;MORISHITA SADAHARU;OHMI TADAHIRO
分类号 H01L21/66 主分类号 H01L21/66
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