SEMICONDUCTOR VERIFICATION DEVICE, METHOD, AND PROGRAM

摘要

In a semiconductor device which can read out only a logical value of an arbitrary storage element, it is possible to read out a logical value of an arbitrary signal at a high speed.  A circuit diagram of the semiconductor device is inputted and a storage element required for calculating a desired signal is detected.  The logical value of the storage element is read out from the semiconductor device so as to determine the logical value of the desired signal in accordance with the logical value of the storage element and the circuit configuration.