| 发明名称 |
SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN |
| 摘要 |
A system and method for generating test patterns for a pattern sensitive algorithm. The method comprises the steps extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.
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| 申请公布号 |
US2010095254(A1) |
申请公布日期 |
2010.04.15 |
| 申请号 |
US20090631899 |
申请日期 |
2009.12.07 |
| 申请人 |
DEMARIS DAVID L;DUNHAM TIMOTHY G;LEIPOLD WILLIAM C;MAYNARD DANIEL N;SCAMAN MICHAEL E;ZHONG SHI |
发明人 |
DEMARIS DAVID L.;DUNHAM TIMOTHY G.;LEIPOLD WILLIAM C.;MAYNARD DANIEL N.;SCAMAN MICHAEL E.;ZHONG SHI |
| 分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
| 代理机构 |
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