发明名称 METHOD OF MEASURING PHYSICAL PROPERTY VALUE OF CELL AND SYSTEM FOR MEASURING PHYSICAL PROPERTY
摘要 Firstly, a shape of a cell as an object of a measurement is modeled, and a complex electric permittivity response when an AC electric field is applied to the cell is obtained through a numerical analysis (Step S1). A numerical calculation is carried out based on that result while values of a membrane capacitance C m and a cell cytoplasm electric conductivity º i are changed, thereby calculating a dielectric spectrum (Step S2). The dielectric spectrum thus calculated is revolved to a dielectric relaxation expression, thereby obtaining a rise ”µ in relative electric permittivity and relaxation time Ä (Step S3). Next, dependency of (”µ, Ä) on (C m , º i ) is obtained, thereby creating a regression expression corresponding to the shape of the cell as the object of the measurement (Step S4). A dielectric spectrum of the cell is actually measured, and the resulting values actually measured and the regression expression are compared with each other, thereby obtaining a membrane capacitance C m, exp and a cell cytoplasm electric conductivity º i, exp of the cell as the object of the measurement (Step 5).
申请公布号 EP2175262(A1) 申请公布日期 2010.04.14
申请号 EP20080791735 申请日期 2008.07.28
申请人 SONY CORPORATION 发明人 KATSUMOTO, YOICHI;HAYASHI, YOSHIHITO
分类号 G01N22/00;G01N27/22;G01N33/48 主分类号 G01N22/00
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