发明名称 Focus correction in electron microscope and particle beam imaging systems
摘要 A computer-implemented system and method for correcting misfocus in original particle beam image data by using a fractional Fourier transform operation or an approximation of it. In one embodiment, the particle beam image data is produced by an electron microscope. The approximation of a fractional Fourier transform operation may comprise a portion of a Taylor series expansion, a Hermite function expansion, a perturbation approximation, a singular integral approximation, or an infinitesimal generator. The described embodiments provide for the reconstruction of phase information associated with the original image data, and for the reconstructed phase information to also utilize an approximation of a fractional Fourier transform operation. The focus correction can be selected and controlled by user interaction or an automatic feedback control system that may include optimization.
申请公布号 US7697777(B2) 申请公布日期 2010.04.13
申请号 US20070929360 申请日期 2007.10.30
申请人 LUDWIG LESTER F 发明人 LUDWIG LESTER F.
分类号 G06K9/40;G02B27/46;G06K9/36 主分类号 G06K9/40
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