发明名称 Slurry composition for chemical mechanical polishing and precursor composition thereof
摘要 Disclosed are a slurry composition for chemical mechanical polishing and a precursor composition thereof. The polishing slurry composition includes deionized water, abrasive particles, a pH-adjusting agent and a surfactant, wherein the surfactant includes two or more ionic moieties and two or more lipophilic groups. The polishing slurry composition can polish convex surfaces of a semiconductor having a step height at a higher rate than the polishing rate for concave surfaces acting as polishing stop layers of the semiconductor so that the polishing can be self-stopped, reduces the occurrence of surface defects after the polishing process, and has a high degree of polishing planarization and good dispersion stability.
申请公布号 US7695637(B2) 申请公布日期 2010.04.13
申请号 US20060615094 申请日期 2006.12.22
申请人 CHEIL INDUSTRIES INC. 发明人 PARK TAE WON;LEE IN KYUNG;CHOI BYOUNG HO
分类号 H01L21/302;B24B37/00;C09K3/14;H01L21/304 主分类号 H01L21/302
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