发明名称 FORMING METHOD OF SILICON OXIDE FILM AND MANUFACTURING METHOD OF NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To form a silicon oxide film acting as a low-temperature and superior insulating film. Ž<P>SOLUTION: Trenches 1a and 1b are formed on a silicon substrate 1, and a coating film is formed by applying a coating agent wherein polymer including silazane bond is solved in an organic solvent. A polymer film is formed by vaporizing the organic solvent contained in the coating film. The polymer film is irradiated with ultraviolet rays at the temperature of 90°C or below, and the polymer film is soaked in purified water or water solution of the temperature of not lower than 50°C and lower than 80°C, to convert into a silicon oxide film 3. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010080709(A) 申请公布日期 2010.04.08
申请号 JP20080247958 申请日期 2008.09.26
申请人 TOSHIBA CORP 发明人 KIYOTOSHI MASAHIRO
分类号 H01L21/316;H01L21/312;H01L21/336;H01L21/76;H01L21/768;H01L21/8247;H01L23/522;H01L27/10;H01L27/105;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/316
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